Discussion of single-event effects testing, analysis methods, and rate prediction for space applications.
This category covers all aspects of SEE characterization and analysis, including:
- Heavy-ion and proton test planning — facility selection, beam cocktails, test board design, DUT preparation, and run plan logistics
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- Cross-section fitting — Weibull parameterization, Edmonds alpha fits, fitting convergence issues, and data weighting approaches
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- Rate prediction methods — CREME96, CREME-MC, OMERE, SPACE RADIATION, RPP assumptions, and Monte Carlo transport
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- SEE mechanisms — SEU, SEL, SEFI, SET, SEB, SEGR, and proton direct ionization in advanced nodes
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- LET conventions — LET(Si) vs. LET(material) for non-silicon device technologies (GaN, SiC)
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- Test data sharing — published databases, data quality, and community data exchange
- Whether you’re planning your first beam campaign or refining rate predictions for a CDR, this is the place to ask questions and share experience.